I.S. EN 61747-5:1999
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
Hardcopy , PDF
08-10-2013
English
04-06-1999
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
1 General
1.1 Scope and object
1.2 Normative references
1.3 Terms, definitions and letter symbols
1.4 Standard atmospheric conditions
1.5 Visual examination and verification of dimensions
1.6 Electrical and optical measurements
1.7 Electrical operating conditions
2 Mechanical test methods
2.1 Robustness of terminations
2.2 Soldering
2.3 Vibration (sinusoidal)
2.4 Shock
2.5 Acceleration, steady state
2.6 Bond strength test
3 Environmental and endurance test methods
3.1 Change of temperature
3.2 Storage (at high temperature)
3.3 Storage (at low temperature)
3.4 Low air pressure
3.5 Damp heat, steady state
3.6 Damp heat, cyclic (12+12-hour cycle)
3.7 Composite temperature/humidity cyclic test support
3.8 Light exposure
3.9 ESD Test
4 Miscellaneous test methods
4.1 Permanence of marking
4.2 Scratch test (of face plate)
4.3 Life test
5 Visual inspection of monochrome matrix liquid crystal
display modules (Excluding all active matrix liquid crystal
display modules)
5.1 General
5.2 Visual inspection of displays
6 Visual inspection of monochrome liquid crystal display cells
(Excluding all active matrix liquid crystal display modules)
6.1 General
6.2 Visual inspection of displays
6.3 Seal inspections
6.4 Visual inspection of contact pad area
6.5 Visual inspection for chipped material at the borders and
edges of the plates of cells
Annex A (informative) - Cross references index
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Gives test methods applicable to liquid crystal display devices.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017) 1999 Edition is Partially Superseded by I.S. EN 61747-10-1. (07/2017)
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DocumentType |
Standard
|
Pages |
88
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Withdrawn
|
Standards | Relationship |
NF EN 61747-5 : 1999 | Identical |
DIN EN 61747-5:1999-02 | Identical |
EN 61747-5:1998 | Identical |
IEC 61747-5:1998 | Identical |
SN EN 61747-5 : 1998 | Identical |
NBN EN 61747-5 : 1999 | Identical |
BS EN 61747-5:1998 | Identical |
HD 323.2.5 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST SA - SIMULATED SOLAR RADIATION AT GROUND LEVEL |
IEC 60068-2-5:2010 | Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.13 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
IEC 60068-2-38:2009 | Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
HD 323.2.30 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
HD 323.2.38 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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