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IEC 60749-34:2010
Current
The latest, up-to-date edition.
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Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French, Spanish, Castilian
28-10-2010
FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Test conditions
7 Precautions
8 Measurements
9 Failure criteria
10 Summary
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