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IEC TS 61945:2000
Current
The latest, up-to-date edition.
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Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
10-03-2000
FOREWORD
Clause
1 Scope and object
2 Normative references
3 Terms
4 Classification of technology analysis
4.1 First level: General visual inspection
(AT1 test)
4.2 Second level: Detailed visual inspection
(AT2 test)
4.3 Third level: Scanning electron microscope
examination under large magnification
(AT3 test)
4.4 Fourth level: Construction analysis (AT4
test)
4.5 Fifth level: Complementary tests (AT5 test)
5 Failure analysis (AT6 test)
5.1 Objective
5.2 Resources
5.3 Description
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