IEC 60112:2003+AMD1:2009 CSV
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Method for the determination of the proof and the comparative tracking indices of solid insulating materials |
IEC 60270:2000+AMD1:2015 CSV
|
High-voltage test techniques - Partial discharge measurements |
IEC 60747-7:2010
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Semiconductor devices - Discrete devices - Part 7: Bipolar transistors |
IEC 61287-1:2014
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Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
IEC 60749-21:2011
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Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability |
IEC 60068-2-58:2015+AMD1:2017 CSV
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Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60749-25:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60749-5:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
IEC 60950:1999
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Safety of information technology equipment |
IEC PAS 62178:2000
|
Temperature cycling |
IEC 60749-1:2002
|
Semiconductor devices - Mechanical and climatic test methods - Part 1: General |
EN 60950:2000/corrigendum:2002
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SAFETY OF INFORMATION TECHNOLOGY EQUIPMENT |
IEC 60749-36:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state |
IEC 60747-5-2:1997+AMD1:2002 CSV
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Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics |
IEC 60191-2:2012 DB
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Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 60747-5-3:1997+AMD1:2002 CSV
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Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods |
IEC 60747-9:2007
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Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs) |
IEC 60068-2-47:2005
|
Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests |
IEC 60068-2-3:1969
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Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC 60747-8:2010
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Semiconductor devices - Discrete devices - Part 8: Field-effect transistors |
IEC 60749-15:2010
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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices |
IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60747-1:2006+AMD1:2010 CSV
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Semiconductor devices - Part 1: General |
IEC 60749-34:2010
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Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
IEC 60749-6:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV
|
Semiconductor devices - Mechanical and climatic test methods |
IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV
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Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations |
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV
|
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 60068-2-28:1990
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Environmental testing - Part 2: Tests. Guidance for damp heat tests |
IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60749-10:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60207:1966
|
Aluminium stranded conductors |
IEC 60747-6:2016
|
Semiconductor devices - Part 6: Discrete devices - Thyristors |
IEC 60068-2-48:1982
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Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage |
IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60749-14:2003
|
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) |
IEC 60664-1:2007
|
Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
IEC 60747-2:2016
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Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
IEC 60749-12:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |