04/30114936 DC : DRAFT JUN 2004
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
Withdrawn date
23-07-2013
Published date
23-11-2012
Publisher
Sorry this product is not available in your region.
EN 50439
Committee |
GEL/9/2
|
DocumentType |
Draft
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
IEC 60747-7:2010 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors |
IEC 61287-1:2014 | Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods |
IEC TS 61287-2:2001 | Power convertors installed on board railway rolling stock - Part 2: Additional technical information |
IEC 61373:2010 | Railway applications - Rolling stock equipment - Shock and vibration tests |
EN 50207:2000 | Railway applications - Electronic power converters for rolling stock |
EN 61373:2010/AC:2017-09 | RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - SHOCK AND VIBRATION TESTS (IEC 61373:2010) |
EN 45545-1 : 2013 COR 2013 | RAILWAY APPLICATIONS - FIRE PROTECTION ON RAILWAY VEHICLES - PART 1: GENERAL |
EN 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
IEC 60747-9:2007 | Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs) |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
EN 50125-1:2014 | Railway applications - Environmental conditions for equipment - Part 1: Rolling stock and on-board equipment |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC 60747-8:2010 | Semiconductor devices - Discrete devices - Part 8: Field-effect transistors |
CECC 50000 : 86 AMD 3 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749-34:2010 | Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
EN 60747-15:2012 | Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 50126 : 1999 | RAILWAY APPLICATIONS - THE SPECIFICATION AND DEMONSTRATION OF RELIABILITY, AVAILABILITY, MAINTAINABILITY AND SAFETY (RAMS) |
IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
IEC 60747-15:2010 | Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.