EN 62132-1:2016

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test conditions
5 Test equipment
6 Test setup
7 Test procedure
8 Test report
Annex A (informative) - Test method comparison table
Annex B (informative) - General test board description
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 1 GHz has been deleted from the title;b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;c) IC performance classes in 8.3 have been modified;d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.