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FED-STD-209 Revision E:1992

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES

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PDF

Superseded date

29-11-2001

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1 Scope and limitations
1.1 Scope
1.2 Limitations
2 Referenced documents
3 Definitions
3.1 Airborne particulate cleanliness class
3.2 Anisokinetic sampling
3.3 Calibration
3.4 Clean zone
3.5 Cleanroom
3.5.1 As-built cleanroom (facility)
3.5.2 At-rest cleanroom (facility)
3.5.3 Operational cleanroom (facility)
3.6 Condensation nucleus counter (CNC)
3.7 Discrete-particle counter (DPC)
3.8 Entrance plane
3.9 Isoaxial
3.10 Isokinetic sampling
3.11 Monitoring
3.12 Nonunidirectional airflow
3.13 Particle
3.14 Particle concentration
3.15 Particle size
3.16 Student's t statistic
3.17 U descriptor
3.18 Ultrafine particles
3.19 Unidirectional airflow
3.20 Upper confidence limit (UCL)
3.21 Verification
4 Airborne particulate cleanliness classes and
           U descriptors
4.1 Class listed in Table I
4.1.1 Measurement at particle sizes listed in Table
           I
4.1.2 Measurement at alternative particle sizes
4.2 Provision for defining alternative airborne
           particulate cleanliness classes
           Table I. Airborne particulate cleanliness
           classes
4.3 Provision for describing ultrafine particle
           concentrations (U descriptors)
4.4 Nomenclature for airborne particle
           concentrations
4.4.1 Format for airborne particulate cleanliness
           classes
4.4.2 Format for U descriptors
5 Verification and monitoring of airborne
           particulate cleanliness
5.1 Verification of airborne particulate
           cleanliness
5.1.1 Frequency
5.1.2 Environmental test conditions
5.1.2.1 State of cleanroom or clean zone during
           verification
5.1.2.2 Environmental factors
5.1.3 Particle counting
5.1.3.1 Sample locations and number: unidirectional
           airflow
5.1.3.2 Sample locations and number:
           nonunidirectional airflow
5.1.3.3 Restrictions on sample locations
5.1.3.4 Sample volume and sampling time
5.1.3.4.1 Single sampling plan for classes in Table I
5.1.3.4.2 Single sampling plan for alternative classes
           or particle sizes
5.1.3.4.3 Single sampling plan for U descriptors
5.1.3.4.4 Sequential sampling plan
5.1.4 Interpretation of the data
5.2 Monitoring of airborne particulate
           cleanliness
5.2.1 Monitoring plan
5.2.2 Particle counting for monitoring
5.3 Methods and equipment for measuring airborne
           particle concentrations
5.3.1 Counting particles 5 micrometers and larger
5.3.2 Counting particles smaller than 5 micrometers
5.3.3 Counting ultrafine particles
5.3.4 Limitations of particle counting methods
5.3.5 Calibration of particle counting
           instrumentation
5.4 Statistical analysis
5.4.1 Acceptance criteria for verification
5.4.2 Calculations to determine acceptance
5.4.2.1 Average particle concentration at a location
5.4.2.2 Mean of the averages
5.4.2.3 Standard deviation of the averages
5.4.2.4 Standard error of the mean of the averages
5.4.2.5 Upper confidence limit (UCL)
           Table II. UCL factor for 95% upper confidence
           limit
5.4.2.6 Sample calculation
6 Recommendation for changes
7 Conflict with referenced documents
8 Federal agency interests
Appendix A - Counting and sizing airborne particles
             using optical microscopy
A10 Scope
A20 Summary of the method
A30 Equipment
A40 Preparation of equipment
A50 Sampling the air
A60 Calibration of the microscope
A70 Counting and sizing particles by optical
           microscopy
A80 Reporting
A90 Factors affecting precision and accuracy
Appendix B - Operation of a discrete-particle counter
B10 Scope and limitations
B20 References
B30 Summary of method
B40 Apparatus and related documentation
B50 Preparation for sampling
B60 Sampling
B70 Reporting
Appendix C - Isokinetic and anisokinetic sampling
C10 Scope
C20 Reference
C30 Background
C40 Methods
           Figure C.1. Probe inlet diameters (metric
           units) for isokinetic sampling, v = vo
           Figure C.2. probe inlet diameters (English
           units) for isokinetic sampling, v = vo
           Figure C.3. Contours of sampling bias,
           c/co = 0.95, 1.05
C50 Example
Appendix D - Method for measuring the concentration of
             ultrafine particles
D10 Scope
D20 References
D30 Apparatus
           Figure D.1. Envelope of acceptability for the
           counting efficiency of a DPC used to verify
           the U descriptor
D40 Determining the concentration of ultrafine
           particles
Appendix E - Rationale for the statistical rules used in
             FED-STD-209E
E10 Scope
E20 The statistical rules
E30 Sequential sampling
E40 Sample calculation to determine statistical
           validity of a verification
Appendix F - Sequential sampling: an optional method for
             verifying the compliance of air to the
             limits of airborne particulate cleanliness
             classes M 2.5 and cleaner
F10 Scope
F20 References
F30 Background
F40 Method
           Figure F.1. Observed count, C, vs. expected
           count, E, for sequential sampling
           Table F.1. Upper and lower limits for time at
           which C counts should arrive
F50 Examples
F60 Reporting
Appendix G - Sources of supplemental information
G10 Scope
G20 Sources of supplemental information

Gives classes of air cleanliness for airborne particulate levels in cleanrooms and zones. Gives methods for class verification and monitoring of air cleanliness. Coverage includes: airborne particulate cleanliness classes and U descriptions; verification and monitoring of airborne particulate cleanliness. Also contains detailed definitions and appendices.

Committee
FSC 3694
DevelopmentNote
E Notice 1 - Notice of Cancellation/Superseded by ISO 14644-1 and ISO 14644-2 (03/2002)
DocumentType
Standard
Pages
56
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

MIL-G-23081 Revision C:1972 Gyroscope Indicator System, Vertical
ANSI INCITS 200 : 1992 INFORMATION SYSTEMS - UNRECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 356 MM WORM OPTICAL DISK CARTRIDGE - PARTS 1 AND 2
MIL-A-83577 Revision B:1988 ASSEMBLIES, MOVING MECHANICAL, FOR SPACE AND LAUNCH VEHICLES, GENERAL SPECIFICATION FOR
MIL-HDBK-337 Base Document:1982 ADHESIVE BONDED AEROSPACE STRUCTURE REPAIR
MIL-STD-1330 Revision D:1996 STANDARD PRACTICE FOR PRECISION CLEANING AND TESTING OF SHIPBOARD OXYGEN, HELIUM, HELIUM-OXYGEN, NITROGEN AND HYDROGEN SYSTEMS
MIL H 38534 : B (1) HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
MIL P 197 : H PACKAGING OF BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES
MIL H 26385 : E HOSE, OXYGEN AND PRESSURIZATION, OZONE RESISTANT
MIL-STD-1246 Revision C:1994 PRODUCT CLEANLINESS LEVELS AND CONTAMINATION CONTROL PROGRAM
MIL H 26626 : D HOSE ASSEMBLY, TETRAFLUOROETHYLENE, OXYGEN
BS EN 62258-1:2010 Semiconductor die products Procurement and use
01/206130 DC : DRAFT AUG 2001 IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
ASTM F 979 : 1986 : R1998 : EDT 1 Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding
ANSI INCITS 199 : 1991 : R2007 INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS
ASTM E 2311 : 2004 : R2016 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
MIL M 9950 : A NOTICE 1 MISSILE COMPONENTS, LIQUID OXYGEN, LIQUID NITROGEN, GASEOUS OXYGEN, GASEOUS NITROGEN, INSTRUMENT AIR, HELIUM AND FUEL HANDLING SYSTEMS, CLEANING AND PACKAGING FOR DELIVERY
MIL-T-24747 Base Document:1991 TECHNICAL REPAIR STANDARDS (TRS) MANUAL; PREPARATION OF
MIL-STD-206 Revision B:1988 FRICTION TORQUE TESTING FOR INSTRUMENT BALL BEARINGS PARTS 1 AND 2
I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
ANSI INCITS 213 : 1994 INFORMATION TECHNOLOGY - 90-MM (3.54-IN) OPTICAL DISK CARTRIDGE REWRITABLE AND READ ONLY USING DISCRETE BLOCK FORMAT (DBF) METHOD FOR DIGITAL INFORMATION INTERCHANGE
ASTM E 1549/E1549M : 2013 Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations
ASTM E 2311 : 2004 : R2009 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
ASTM F 1394 : 1992 : R2005 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
ASTM E 2088 : 2006 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
ASTM E 2217 : 2012 : REDLINE Standard Practice for Design and Construction of Aerospace Cleanrooms and Contamination Controlled Areas
ASTM F 612 : 1988 Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)
ASTM F 584 : 2006 : EDT 1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire (Withdrawn 2015)
ASTM E 2088 : 2006 : R2011 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
ASTM F 584 : 2006 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
ASTM F 816 : 1983 : R2003 Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages (Withdrawn 2009)
BS EN 13091:2000 Biotechnology. Performance criteria for filter elements and filtration assemblies
DIN EN 14736:2004-09 SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES
EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
ASTM F 1708 : 2002 Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003)
MIL-STD-976 Revision B:1988 CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS
ASTM E 2311 : 2004 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
MIL-STD-1695 Base Document:1977 ENVIRONMENTS, WORKING, MINIMUM STANDARDS FOR
DOD-STD-347 Base Document:1985 PRODUCT ASSURANCE PROGRAM REQUIREMENTS FOR FIBER OPTIC COMPONENTS
MIL-F-48382 Revision A:1985 FUZE, M934E6, IMPACT SWITCH FOR
BS PD ES 59008-5.1 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-1: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE
ASTM E 2090 : 2012 : REDLINE Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
BS PD ES 59008-4.2 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 4-2: SPECIFIC REQUIREMENTS AND RECOMMENDATIONS - HANDLING AND STORAGE
ASTM E 874 : 2011 : REDLINE PRACTICE FOR ADHESIVE BONDING OF ALUMINUM FACINGS TO NONMETALLIC HONEYCOMB CORE FOR SHELTER PANELS
ASTM F 816 : 1983 : R1998 : EDT 1 Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
ANSI INCITS 191 : 1991 INFORMATION SYSTEMS - RECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 130 MM WRITE-ONCE SAMPLED-SERVO RZ SELECTABLE-PITCH OPTICAL DISK CARTRIDGE
ANSI INCITS 246 : 1994 INFORMATION PROCESSING SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS OF 90 MM READ ONLY AND REWRITABLE M.O. OPTICAL DISK DATA STORAGE CARTRIDGE WITH DISCRETE BLOCK FORMAT (DBF)
ASTM F 1394 : 1992 : R2012 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
ASTM F 1394 : 1992 : R1999 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
ASTM E 2352 : 2019 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments—Cleanroom Operations
ASTM E 2042 : 2004 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
ASTM E 2352 : 2004 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations
ASTM E 1548 : 2009 : R2017 Standard Practice for Preparation of Aerospace Contamination Control Plans
ASTM E 1548 : 2009 Standard Practice for Preparation of Aerospace Contamination Control Plans
ASTM E 2042/E2042M : 2009 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
ASTM A 380 : 2006 Standard Practice for Cleaning, Descaling, and Passivation of Stainless Steel Parts, Equipment, and Systems
ASTM F 50 : 2012 : R2015 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
ASME B89.6.2 : 1973 : R2017 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
ASME B89.6.2 : 1973 : R2003 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
ASME B89.6.2 : 1973 : R2012 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
MIL-STD-1774 Base Document:1982 PROCESS FOR CLEANING HYDRAZINE SYSTEMS AND COMPONENTS
ES 59008-5-2 : 2001 DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES
MIL-F-48863 Revision C:1985 FUZE, GUIDED MISSILE, M934E6 PARTS ASSEMBLY, LOADING & PACKING FOR
I.S. EN 14736:2004 SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES
ASTM F 804 : 1983 : R1990 : EDT 1 Practice for Producing Spin Coating Resist Thickness Curves (Withdrawn 1997)
MIL V 87223 : 0 VALVE, PRESSURE, ANTI-G SUIT, MXU-804/A AND MXU-805/A
MIL-I-81454 Base Document:1967 INDICATOR, GYROSCOPE, VERTICAL REFERENCE ID-1481 (*)/A
MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
MIL-G-81937 Revision A:1984 GREASE, INSTRUMENT, ULTRA CLEAN, METRIC
MIL-HDBK-349 Base Document:1994 MANUFACTURE AND INSPECTION OF ADHESIVE BONDED, ALUMINUM HONEYCOMB SANDWICH ASSEMBLIES FOR AIRCRAFT
MIL-STD-1359 Revision B:1987 CLEANING METHODS AND PROCEDURES FOR BREATHING OXYGEN EQUIPMENT
MIL-C-85300 Base Document:1982 COOLER, CRYOGENIC DETECTOR
MIL R 28750 : C SUPP 1 RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING
ASTM F 979 : 1986 : R2003 Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Withdrawn 2009)
ES 59008-4-2 : 2000 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE : SPECIFIC REQUIREMENTS AND RECOMMENDATIONS HANDLING AND STORAGE
MIL-B-913 Base Document:1993 BEARINGS, BALL, ANNULAR, FOR INSTRUMENTS AND PRECISION ROTATING COMPONENTS (METRIC) GENERAL SPECIFICATION FOR
SAE AS 13591 : 2001 CLEANING METHODS &PROCEDURES FOR BREATHING OXYGEN EQUIPMENT
PD ES 59008-2:1999 Data requirements for semiconductor die Vocabulary
ASTM E 2088 : 2006 : R2015 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
ASTM E 1549/E1549M : 2013 : R2016 Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations
SAE ARP 599 : 2013 AEROSPACE - DYNAMIC TEST METHOD FOR DETERMINING THE RELATIVE DEGREE OF CLEANLINESS OF THE DOWNSTREAM SIDE OF FILTER ELEMENTS
NASA KSC STD Z 0010 : 1983 DESIGN OF ENVIRONMENTAL CONTROL SYSTEMS, GROUND COOLANT SYSTEMS, COOLANT SERVICING SYSTEMS, AND GROUND SUPPORT EQUIPMENT, STANDARD FOR
MIL-S-85333 Base Document:1979 SAFETY ARMING DEVICE MARK 33 MOD 1
ASTM F 691 : 1980 : R1991 : EDT 1 Practice for Preparing Photoplates for Measuring Flatness Deviation (Withdrawn 1996)
CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
ASTM F 863 : 1984 : R1992 : EDT 1 Practice for Detection of Defects in Spin-Coated Resist (Withdrawn 1996)
ASTM F 864 : 1984 : R1992 Practice for Inspection of Hardsurface Glass Photoplates (Withdrawn 1996)
ASTM F 890 : 1984 : R1992 Practice for Determining Pinhole Density in Photoresist Films Used in Microelectronic Device Processing (Withdrawn 1996)
MIL B 197 : F INT AMD 2 BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES, PREPARATION FOR DELIVERY OF
BS PD ES 59008-5.2 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES
MIL-F-48388 Revision A:1985 FUZE, M934E6, LAUNCH SENSING SWITCH FOR
MIL-B-81793 Revision D:1993 BEARING, BALL, PRECISION, FOR INSTRUMENTS AND ROTATING COMPONENTS
ASTM F 849 : 1983 : R1988 Method for Identification and Test of Structures and Contaminants Seen on Polished Gadolinium Gallium Surfaces (Withdrawn 1992)
MIL V 87255 : 0 VALVE, PRESSURE, ANTI-G SUIT, HIGH FLOW
ASTM E 1731M : 1995 Standard Test Method for Gravimetric Determination of Nonvolatile Residue from Cleanroom Gloves [Metric] (Withdrawn 2000)
ANSI INCITS 199 : 1991 : R2002 INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS
ANSI INCITS 234 : 1993 INFORMATION SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS - 130 MM REWRITABLE OPTICAL DISK DATA STORAGE CARTRIDGES WITH CONTINUOUS COMPOSITE SERVO (CCS)
ASTM E 2042/E2042M : 2009 : R2016 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
ASTM E 2900 : 2012 Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout
ASTM E 1235 : 2012 : REDLINE Standard Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft
ASTM E 1235M : 1995 Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft [Metric] (Withdrawn 2000)
EN 14736:2004 Space product assurance - Quality assurance for test centres
MIL-G-23083 Revision C:1972 Gyroscope, Rate Switching MS 17399
ASTM F 416 : 1994 Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
NASA KSC SO S 9 : 1993 RETEST AND REFURBISHMENT OF COMPRESSED GAS TRAILERS AND MOVABLE STORAGE UNITS, STANDARD FOR
DEFSTAN 18-1/2(1990) : 1990 GUIDELINES AND STANDARDS FOR THE PROCUREMENT OF MILITARY SPACECRAFT SYSTEMS
MIL R 39023 : A RESISTOR, VARIABLE, NON WIRE WOUND, PRECISION GENERAL SPECIFICATION FOR
MIL-STD-977 Base Document:1982 TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION
SAE AIR4728 References, Spacecraft and Spacecraft Servicing, Fluid System Components (Abbreviations, Acronyms, Definitions, Applicable Documents and Environmental Conditions)
ES 59008-5-1 : 2001 DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE
MIL-STD-2111 Base Document:1979 TECHNICAL REPAIR STANDARDS, ELECTRONIC (2Z/4G/7Z/7G REPAIRABLES), PREPARATION OF
ASTM E 1234 : 2012 : REDLINE Standard Practice for Handling, Transporting, and Installing Nonvolatile Residue (NVR) Sample Plates Used in Environmentally Controlled Areas for Spacecraft
ASTM F 50 : 2012 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
ASTM E 2352 : 2004 : R2010 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations
IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
BS EN 14736:2004 Space product assurance. Quality assurance for test centres

FED-STD-376 Revision B:1993 PREFERRED METRIC UNITS FOR GENERAL USE BY THE FEDERAL GOVERNMENT

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