BS EN 120000:1996
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
Hardcopy , PDF
English
15-09-1996
Important note : Users cannot be edited or removed once added to your Multi user PDF.
Committees responsible
National foreword
Foreword
PART 1: Semiconductor optoelectronic and liquid devices
1 SCOPE
2 GENERAL
3 QUALITY ASSESSMENT PROCEDURES
4 TEST AND MEASUREMENT CONDITIONS
5 LASER MODULE RELIABILITY
PART 2: Visual inspection of LCD and rejection criteria
1 General
2 Visual inspection of viewing area
3 Seal inspection
4 Visual inspection of contact surface
5 Visual inspection for chipped material at the corners
and edges of the glass plates
6 Visual inspection of the display
PART 3: Visual inspection requirements for opto-electronic
semiconductor devices
1 General
2 Visual inspection requirements for dies
3 Visual inspection requirements for bonded die
4 Visual inspection requirements for packaged
devices
PART 4: Capability approval
1 Introduction
2 Terminology
3 Procedure for granting the capability approval
4 Capability approval maintenance procedure
5 Procedure for reduction, extension or change of
capability
6 Procedure in case of deficiency in maintenance of the
capability approval
7 Capability manual
8 Capability test programme
9 Verification of capability (audit)
10 Quality assurance of products delivered under
capability approval
11 Marking and ordering information
12 Capability abstract for publication purposes
13 Customer detail specifications
14 Standard catalogue items detail specifications
15 Detail specification register
16 Handling
17 Product safety
PART 5: Semiconductor laser diodes, laser diode modules
and laser diode assemblies of assessed quality -
Capability approval
1 General
2 Quality assessment procedures
3 Test and measurement procedures
Specifies quality assessment procedures,test methods and terminology required in the preparation of detailed specifications for optoelectronic and liquid crystal devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS CECC20000(1983) which remains current. Supersedes 93/203878 DC and 91/03056 DC. (08/2005)
|
| DocumentType |
Standard
|
| Pages |
276
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| SN EN 120000 : 1996 | Identical |
| NEN EN 120000 : 1997 | Identical |
| EN 120000 : 1996 | Identical |
| DIN EN 120000:1996-09 | Identical |
| I.S. EN 120000:1998 | Identical |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS EN 60068-2-6:2008 | Environmental testing Tests. Test Fc. Vibration (sinusoidal) |
| BS 6493-1.2:1984 | Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
| BS EN 60068-1:2014 | Environmental testing General and guidance |
| IEC 60270:2000+AMD1:2015 CSV | High-voltage test techniques - Partial discharge measurements |
| CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
| HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| BS EN 60068-2-27:2009 | Environmental testing Tests. Test Ea and guidance. Shock |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| EN 60065:2014/AC:2017-01 | AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016) |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60794-1:1996 | Optical fibre cables - Part1: Generic specification (Revision to IEC 794-1) |
| IEC 60793-2:2015 | Optical fibres - Part 2: Product specifications - General |
| BS CECC 00109:1991 | Rule of Procedure 9. Certified test records |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| BS 6001-1:1991 | Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
| IEC 60793-1:1992 | Optical fibres - Part 1: Generic specification |
| BS 2754(1976) : 1976 | MEMORANDUM - CONSTRUCTION OF ELECTRICAL EQUIPMENT FOR PROTECTION AGAINST ELECTRIC SHOCK |
| BS CECC00014(1988) : 1988 AMD 7195 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: CECC ASSESSED PROCESS AVERAGE PROCEDURE (60 % CONFIDENCE LIMIT) |
| HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
| EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
| IEC 60693:1980 | Dimensions of optical fibres |
| IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
| BS 2011-2.1Z/AD:1977 | Environmental testing. Tests Tests Z/AD. Composite temperature/humidity cyclic test |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2045:1965 | Preferred numbers |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| IEC 60068-2-38:2009 | Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| HD 323.2.30 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
| EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
| BS EN 60068-2-7:1993 | Environmental testing. Test methods Test Ga and guidance. Acceleration, steady state |
| CECC 43000 : 1982 | GENERIC SPECIFICATION: THERMISTORS |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| EN 60068-2-17:1994 | Environmental testing - Part 2: Tests - Test Q: Sealing |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| CECC 20000 : 82 AMD 3 | GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60148B:1979 | Supplement B - Letter symbols for semiconductor devices and integrated microcircuits |
| ISO 2015:1976 | Numbering of weeks |
| BS EN 60068-2-17:1995 | Environmental testing. Test methods Test Q. Sealing |
| CECC 00200 : 2002 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
| EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
| ISO 497:1973 | Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
| IEC 60148A:1974 | First supplement - Letter symbols for semiconductor devices and integrated microcircuits |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS EN 60065 : 2014 | AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014, MODIFIED) |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| HD 323.2.21 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST U: ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| BS EN ISO 9000:2015 | Quality management systems. Fundamentals and vocabulary |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
| HD 323.2.38 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.