BS EN 62747:2014
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Terminology for voltage-sourced converters (VSC) for high-voltage direct current (HVDC) systems |
BS EN 153000:1998
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Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
07/30161967 DC : 0
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BS EN 60747-8 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8: FIELD-EFFECT TRANSISTORS |
I.S. EN 60749-34:2010
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
BS EN 60749-34:2010
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Semiconductor devices. Mechanical and climatic test methods Power cycling |
BS IEC 60747-8-4:2004
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Discrete semiconductor devices Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications |
IEC 60747-8-4:2004
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Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications |
CEI EN 60747-15 : 2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
I.S. EN 62751-1:2014
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POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS - PART 1: GENERAL REQUIREMENTS |
IEC 60749-34:2010
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Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
EN 153000:1998
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Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval) |
EN 60747-15:2012
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Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
EN 62747:2014/AC:2015
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TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS (IEC 62747:2014) |
EN 60749-34:2010
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Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling |
EN 61643-321:2002
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Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD) |
BS EN 150009:1993
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Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
BS EN 150008:1993
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Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
I.S. EN 62747:2014-2015-10
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TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS |
IEEE C62.42.3-2017
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IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction |
CEI EN 61643-341 : 2002
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COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS) |
I.S. EN 60747-15:2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV)) |
BS IEC 60747-9:2007
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Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs) |
CEI EN 61643-321 : 2003
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COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 321: SPECIFICATIONS FOR AVALANCHE BREAKDOWN DIODE (ABD) |
IEC 60747-9:2007
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Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs) |
I.S. EN 153000:1998
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DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION) |
BS CECC50008(1992) : 1992 AMD 7698
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: AMBIENT RATED RECTIFIER DIODES |
BS CECC50009(1992) : 1992 AMD 7699
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE RATED RECTIFIER DIODES |
09/30209939 DC : 0
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BS EN 60749-34 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
01/206102 DC : DRAFT JUL 2001
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IEC 60747-8-12 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 8-12: 8-12: METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS POWER SWITCHING APPLICATIONS |
07/30162213 DC : 0
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BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
12/30251416 DC : 0
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BS EN 62747 - TERMINOLOGY FOR VOLTAGE-SOURCED CONVERTERS (VSC) FOR HVDC SYSTEMS |
BS EN 61643-321:2002
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Low voltage surge protective devices Specifications for avalanche breakdown diode (ABD) |
CEI EN 60749-34 : 2012
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
BS EN 62751-1:2014
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems General requirements |
BS EN 120000:1996
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Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
BS EN 60747-15:2012
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Semiconductor devices. Discrete devices Isolated power semiconductor devices |
I.S. EN 62751-2:2014
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POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) SYSTEMS - PART 2: MODULAR MULTILEVEL CONVERTERS |
17/30343732 DC : 0
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BS EN 60747-9 - SEMICONDUCTOR DEVICES - PART 9: DISCRETE DEVICES - INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS) |
PD IEC/TR 60601-4-3:2015
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Medical electrical equipment Guidance and interpretation. Considerations of unaddressed safety aspects in the third edition of IEC 60601-1 and proposals for new requirements |
IEC 60747-8:2010
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Semiconductor devices - Discrete devices - Part 8: Field-effect transistors |
BS EN 62751-2:2014
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems Modular multilevel converters |
EN 61643-341:2001
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Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
BS EN 61643-341:2001
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Low voltage surge protective devices Specification for thyristor surge suppressors (TSS) |
BS IEC 60747-8:2000
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Discrete semiconductor devices and integrated circuits Field-effect transistors - Additional ratings and characteristics and amds in the measuring methods for power switching field effect transistors. |
12/30253588 DC : 0
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BS EN 62751-2 - DETERMINATION OF POWER LOSSES IN VOLTAGE SOURCED CONVERTER (VSC) VALVES FOR HVDC SYSTEMS - PART 2: MODULAR MULTILEVEL CONVERTERS |
04/30113287 DC : DRAFT MAY 2004
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IEC 60747-9 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED GATE BIPOLAR TRANSISTORS (IGBTS) |
04/30114936 DC : DRAFT JUN 2004
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EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES |
EN 62751-1:2014
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirements |
EN 62751-2:2014
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters |
IEC 61643-321:2001
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Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD) |
IEC 61747-1:1998+AMD1:2003 CSV
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Liquid crystal and solid-state display devices - Part 1: Generic specification |
UNE-EN 60749-34:2011
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Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling |
IEC 62751-2:2014
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel converters |
05/30135225 DC : DRAFT JUN 2005
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IEC 60749-9 ED 2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 9: INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS) |
12/30252799 DC : 0
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BS EN 62751-1-1 - DETERMINATION OF POWER LOSSES IN VOLTAGE SOURCED CONVERTERS (VSC) FOR HV DC SYSTEMS - PART 1: GENERAL REQUIREMENTS |
BS QC 750000(1986) : 1986
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
IEC 62751-1:2014+AMD1:2018 CSV
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Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirements |
IEC 61643-341:2001
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Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
IEC 60747-15:2010
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Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |