BS EN 60749:1999
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices. Mechanical and climatic test methods
Hardcopy , PDF
01-10-2005
BS EN 60749-11:2002
BS EN 60749-32 : 2003
BS EN 60749-10:2002
BS EN 60749-27 : 2006
BS EN 60749-15:2010
BS EN 60749-3:2002
BS EN 60749-14:2003
BS EN 60749-26:2014
BS EN 60749-39:2006
BS EN 60749-5:2017
BS EN 60749-12:2002
BS EN 60749-6:2002
BS EN 60749-7:2011
BS EN 60749-1:2003
BS EN 60749-31:2003
BS EN 60749-4:2002
BS EN 60749-22:2003
BS EN 60749-13:2002
BS EN 60749-25:2003
BS EN 60749-9:2002
BS EN 60749-36:2003
BS EN 60749-20:2009
BS EN 60749-8:2003
BS EN 60749-19 : 2003
BS EN 60749-2:2002
BS EN 60749-27:2006+A1:2012
BS EN 60749-19:2003+A1:2010
BS EN 60335-2-11:2001
BS EN 60749-7:2002
BS EN 60749-21:2005
BS EN 60749-5:2003
BS EN 60749-15:2003
BS EN 60749-20:2003
BS EN 60749-32:2003+A1:2010
BS EN 60749-26:2006
English
23-09-2002
Chapter 1: General
1 Scope and object
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 External visual examination and verification of dimensions
6 Electrical measurements
Chapter 2: Mechanical test methods
1 Robustness of terminations
1.1 Tensile
1.2 Bending
1.3 Torsion
1.4 Torque
2 Soldering
2.1 Solderability
2.2 Resistance to soldering heat
2.3 Resistance of plastic encapsulated SMDs to the
combined effect of moisture and soldering heat
3 Vibration (sinusoidal)
4 Shock
5 Acceleration, steady state
6 Bond strength test
6.1 General
6.2 Methods A and B
6.3 Method C
6.4 Method D
6.5 Methods E and F
6.6 Method G: Wire ball shear test
6.7 Information to be given in the relevant specification
7 Die shear strength test
7.1 Object
7.2 Description of the test apparatus
7.3 Test method
7.4 Failure criteria
7.5 Requirements
7.6 Information to be given in the relevant
specification
Chapter 3: Climatic Test Methods
1 Change of temperature
1.1 Rapid change of temperature: two-chamber method
1.2 Rapid change of temperature: two-fluid-bath method
2 Storage (at high temperature)
3 Low air pressure
4A Damp heat, steady state
4B Damp heat, steady state, accelerated
4C Damp heat, steady state, highly accelerated
5 Sealing
5.1 General terms
5.2 Bomb pressure test
5.3 Fine leak detection: radioactive krypton method
5.4 Fine leak detection: tracer gas method with mass spectrometer
5.5 Gross leak, perfluorocarbon vapour method using electronic
detection apparatus
5.6 Gross leak - perfluorocarbon - bubble detection method
5.7 Test condition E, weight-gain gross-leak detection
5.8 Penetrant dye gross leak detection
5.9 Gross leak re-tests
6 Salt mist
7 Thermal intermittence test
8 Internal moisture content measurement by mass
spectrometry method
8.1 Object
8.2 General description
8.3 Test apparatus
8.4 Preconditioning
8.5 Conditioning
8.6 Requirements
8.7 Information to be given in the relevant specification
8.8 Guidance
Chapter 4: Miscellaneous Test Methods
1 Flammability tests of plastic-encapsulated devices
1.1 Flammability (internally induced)
1.2 Flammability (externally induced)
2 Permanence of marking
Annex A (normative) Guidance
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Uniform preferred test methods and values for stress levels for judging the environmental properties of semiconductor devices (discrete and integrated circuits) from which a selection may be made.
Standards | Relationship |
I.S. EN 60749:1944 | Identical |
NBN EN 60749 : 99 AMD 2 2002 | Identical |
SN EN 60749 : 1999 AMD 1 2000 | Identical |
DIN EN 60749:2002-09 | Identical |
UNE EN 60749 : 2000 A2 2002 | Identical |
EN 60749 : 99 AMD 2 2001 | Identical |
NF EN 60749 : 99 AMD 2 2002 | Identical |
IEC 60653:1979 | General considerations on ultrasonic cleaning |
HD 323.2.11 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST KA: SALT MIST |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
HD 323.2.13 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
HD 323.2.48 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - GUIDANCE ON THE APPLICATION OF THE TESTS OF IEC PUBLICATION 68 TO SIMULATE THE EFFECTS OF STORAGE |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
IEC 60068-2-47:2005 | Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-17:1994 | Environmental testing - Part 2: Tests - Test Q: Sealing |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60068-2-48:1982 | Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
EN 60695-2-2:1994/A1:1995 | FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST |
EN 60068-2-47:2005 | Environmental testing - Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
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